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Characterization Techniques

Atomic Force Microscopy AFM AFM 3D topographic image
Auger Electron Spectroscopy AES Scanning Auger Microscope
Contact Angle Contact Angle Characterization
Density: Helium Pycnometry Density: Helium Pycnometry
Electrical Characterization Lab ECL Electrical Characterization
Electron Backscattered Diffractometry EBSD EBSD Figure
Electron Probe Microanalysis EPMA EPMA
Energy Dispersive Spectroscopy EDS EDS
Focused Ion Beam FIB Focus Ion Beam
General Sample Prep General Sample Prep General Sample Prep
Infrared Spectroscopy FT-IR FT-IR - Infrared Spectroscopy
Mechanical Mechanical Characterization
Mercury Porosimetry Mercury Porosimetry
Nanoindentation Nanoindentation
Nanoscale Infrared Spectroscopy Nano-IR/AFM-IR Nanoscale Infrared Spectroscopy
Optical Microscopy Optical Microscopy
Optical Profilometry Optical Profilometry
Particle Size Analysis particle sizing
Raman Spectroscopy Raman Spectroscopy
Reflection Electron Energy Loss Spectroscopy REELS Electron Beam Example
Sample Sectioning and Cutting Laser Cutter
Scanning Electron Microscopy SEM Scanning Electron Microscopy
Surface Area Surface Area
Thermal Analysis Thermal
Time of Flight Secondary Ion Mass Spectrometry TOF-SIMS TOF-SIMS image
Transmission Electron Microscopy TEM TEM Image
X-Ray Photoelectron Spectroscopy XPS XPS
X-ray Scattering XRD / SAXS-WAXS X-ray Scattering
Zeta Potential Zeta Potential

Explore More

  • Characterization Techniques
    • Atomic Force Microscopy
    • Auger Electron Spectroscopy
    • Contact Angle
    • Density: Helium Pycnometry
    • Electrical Characterization Lab
    • Electron Backscattered Diffractometry
    • Electron Probe MicroAnalysis
    • Energy Dispersive Spectroscopy
    • Focused Ion Beam
    • Infrared Spectroscopy
    • Mechanical
    • Mercury Porosimetry
    • Nanoindentation
    • Nanoscale Infrared Spectroscopy
    • Optical Microscopy
    • Optical Profilometry
    • Particle Size Analysis
    • Raman Spectroscopy
    • Reflection Electron Energy Loss Spectroscopy
    • Sample Prep
    • Scanning Electron Microscopy
    • Surface Area
    • Thermal Analysis
    • Time of Flight Secondary Ion Mass Spectrometry
    • Transmission Electron Microscopy
    • Ultraviolet Photoelectron Spectroscopy
    • Ultraviolet-Visible-near-IR Spectroscopy
    • X-Ray Photoelectron Spectroscopy
    • X-ray Scattering
    • Zeta Potential
  • Materials Processing
  • Sample Prep
  • For Industry
  • Access to Facilities
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Penn State
Materials Research Institute
© The Pennsylvania State University Materials Research Institute. All rights reserved.

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  • addressThe Materials Research Institute
    Millennium Science Complex
    491 Pollock Road
    University Park, PA 16802

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Acknowledgement Guidelines

  • acknowledgementsMRI Facilities: Acknowledgement Guidelines for MCL, Nanofab, 2DCC-MIP
Copyright © The Pennsylvania State University | Materials Research Institute. All rights reserved.

The 2DCC-MIP is funded by NSF cooperative agreement DMR-2039351.

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