On Tuesdays and Thursdays and occasional Fridays throughout the summer MCL staff will be offering a series of free, one-hour lectures and workshops on various characterization topics. These will include a mixture of basic overviews of techniques aimed at anyone interested in these methods and more focused workshops primarily aimed at users who are currently trained in a technique but want to pursue a more advanced skill.
LOCATION:
Millennium Science Complex, N-205
REGISTRATION IS STRONGLY ENCOURAGED:
SUMMER WORKSHOPS & LECTURES :: 2024 |
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JUNE SCHEDULE |
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WORKSHOP |
June 13 - Thursday This lecture is aimed at anyone with an interest in learning about X-ray photoelectron spectroscopy. The principle of the technique will be discussed and the advantages and disadvantages along with case studies. |
WORKSHOP |
June 18 - Tuesday This lecture introduces curve fitting of XPS data. It is aimed at people who are currently generating XPS data or processing data generated on their behalf. It is meant to be combined with the hands-on Workshop on "Curve fitting using CasaXPS Software". It will discuss constraining of fitting parameters, asymmetric vs symmetric line shapes, and checking the validity of your fits. |
WORKSHOP |
June 20 - Thursday Bring your laptop pre-loaded with CasaXPS software to this workshop. It is aimed at people who are currently processing XPS data. Some model raw data files will be shared ahead of the workshop and we will work through the process of curve fitting various examples. If you are interested but do not yet have CasaXPS software, please contact Jeff Shallenberger (jxs124@psu.edu) prior to the workshop. |
WORKSHOP |
June 25 - Tuesday This lecture will cover what effects the signal generation in an XPS experiment. It will discuss both first principles and lab-derived quantification. It is aimed at anyone with an interest in this topic. |
WORKSHOP | June 27 - Thursday 1:00 p.m. - 2:00 p.m. Quantifying XPS Data Using CasaXPS |
JULY SCHEDULE |
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WORKSHOP | July 9 - Tuesday 1:00 p.m. - 2:00 p.m. Ion Beam Depth Profiling with XPS |
WORKSHOP | July 11 - Thursday 1:00 p.m. - 2:00 p.m. XPS of 2D Materials |
WORKSHOP |
July 12 - Friday We will go over the implications of each parameter in the spectral acquisition on the quality of your data. We will talk about aperture size, resolution, apodization functions, phase resolution, zero-filling, and more. |
WORKSHOP | July 16 - Tuesday 1:00 p.m. - 2:00 p.m. XPS of Semiconductors |
WORKSHOP |
July 19 - Friday Reviewing the common errors and artifacts observed in FT-IR spectra. We will go over the sources of these artifacts in sample prep, spectral acquisition and data manipulation as well as ways of avoiding them. |
REGISTRATION IS STRONGLY ENCOURAGED: