Measuring the thermally emitted radiation of coatings, devices, and other materials has become an increasingly important topic as coatings are being applied to manage increasing heat loads on our infrastructure and as devices are pushed to higher limits. Characterizing the emissive property is relevant for developing technologies in energy conversion, imaging, and thermal management. The MCL has recently developed methods to quantify the wavelength and intensity of the thermally emitted radiation from various samples ranging in size from 10’s of microns to the macro-scale.
