THIS COURSE IS FOR TRAINED USERS OF THE MATERIALS CHARACTERIZATION LAB ONLY

WHEN
June 20-21, 2024

WHERE
Millennium Science Complex, N-008

GUEST PRESENTER
Scott Speakman
Principal Scientist at Malvern Panalytical 

REGISTRATION REQUIRED (seating is limited)
$30 (will cover the cost of the course and DAY 1 lunch)

DETAILS

DAY 1 - Thursday, June 20, 2024
This full-day workshop focused on Malvern Panalytical's XRD Analysis software package for phase identification, Rietveld refinement, semi-quantitative phase analysis, profile fitting, and more - HighScore.

9:00 a.m. - 4:30 p.m. (12 noon, 30-minute break for lunch)
Attendees will receive a development copy of the HighScore software that expires in August to install on personal laptops prior to the course. Malvern Panalytical is also working on a version that will be valid for six months but can not guarantee that it will be available for this workshop.

DAY 2 - Friday, June 21, 2024
This half-day workshop will be offered on additional Malvern Panalytical software.

9:00 a.m. - 12 noon
AMASS software for displaying, analyzing, simulating, and fitting X-ray scattering from layered structures. It supports rocking curves, 2-axes scans, reciprocal space maps of thin heteroepitaxial layers, particularly single-crystal and highly textured thin-layer samples as well as X-ray reflectometry data and off-specular (diffuse) scattering data of arbitrary multi-layer structures.

1:00 p.m. - 4:00 p.m.
Residual Stress software - Stress Plus for analyzing residual stress in polycrystalline coatings and bulk materials.

Register Here

9:00 a.m. - 4:30 p.m. This full-day workshop focused on Malvern Panaltyical's XRD Analysis software package for phase identification, Rietveld refinement, semi-quantitative phase analysis, profile fitting, and more - HighScore.
9:00 a.m. - 12 noon AMASS software for displaying, analyzing, simulating, and fitting X-ray scattering from layered structures. It supports rocking curves, 2-axes scans, reciprocal space maps of thin heteroepitaxial layers, particularly single-crystal and highly textured thin-layer samples as well as X-ray reflectometry data and off-specular (diffuse) scattering data of arbitrary multi-layer structures.
1:00 p.m. - 4:00 p.m. Residual Stress software - Stress Plus for analyzing residual stress in polycrystalline coatings and bulk materials.
LEO Project number format e.g., 12-345
Internal Order/Budget format e.g., 987654321000