A multipurpose x-ray diffractometer installed last semester now enables analyses that were previously challenging or impossible. Examples to be discussed include: steel, stainless steel, and Inconel alloys; manganese-containing materials; microscopic polymers embedded within electronic devices; and tiny fragments of ancient art. This talk will also highlight the new capabilities, which include multiple radiation sources, a variety of optics for analyzing spot sizes from micron to tens of millimeter, and a 2D area detector.
