Orientation domain dispersions in wafer scale epitaxial monolayer WSe2 on sapphire
Project Summary: Azimuthal reflection high-energy electron diffraction (ARHEED) is demonstrated as a powerful technique to measure the symmetry, lattice constants and in-plane orientation domain dispersion in wafer-scale, continuous monolayer WSe2 epitaxially grown on c-plane sapphire by metalorganic chemical vapor deposition.