On Tuesdays and Thursdays throughout the summer MCL staff will be offering a series of free, one-hour lectures and workshops on various characterization topics. These will include a mixture of basic overviews of techniques aimed at anyone interested in these methods and more focused workshops primarily aimed at users that are currently trained in a technique but want to pursue a more advanced skill. The May offerings are listed below. June, July, and August offerings will be released soon. If you would like to suggest a specific topic, please contact Josh Stapleton (jjs366@psu.edu) or Jeff Shallenberger (jxs124@psu.edu).
Instructions for Signing Up
- Select which lecture or workshop you wish to attend, click "Sign Up Here".
- Select the date on the calendar.
- Select the time to the right of the calendar.
- Provide your name and email, click "Book".
- A confirmation with a calendar invite will be emailed to you.
MAY SCHEDULE |
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May 17 - Tuesday This lecture is aimed at anyone with an interest in learning about X-ray photoelectron spectroscopy. The principle of the technique will be discussed and the advantages and disadvantages along with case studies. SIGN UP TO ATTEND IN-PERSON: SIGN UP TO ATTEND VIRTUALLY: |
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May 19 - Thursday The focused ion beam (FIB) is a complement to a scanning electron microscope (SEM). The two can be used to observe the subsurface structure and make site-specific modifications. FIB also enables one to 1) perform complex patterning, 2) make site-specific cross-sections, 3) prepare transmission electron microscopy (TEM) samples and 4) observe the 3D structure by serial sectioning. This talk is geared toward those who want to hear the types of problems that can be solved with the FIB. SIGN UP TO ATTEND IN-PERSON: SIGN UP TO ATTEND VIRTUALLY: |
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May 24 - Tuesday This lecture introduces curve fitting of XPS data. It is aimed at people who are currently generating XPS data or processing data generated on their behalf. It is meant to be combined with the hands-on Workshop on "Curve fitting using CasaXPS Software". It will discuss constraining of fitting parameters, asymmetric vs symmetric line shapes, and checking the validity of your fits. SIGN UP TO ATTEND IN-PERSON: SIGN UP TO ATTEND VIRTUALLY: |
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May 26 - Thursday Bring your laptop pre-loaded with CasaXPS software to this workshop. It is aimed at people who are currently processing XPS data. Some model raw data files will be shared ahead of the workshop and we will work through the process of curve fitting various examples. If you are interested but do not yet have CasaXPS software, please contact Jeff Shallenberger (jxs124@psu.edu) prior to the workshop. IN-PERSON ONLY: |
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JUNE SCHEDULE |
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| LECTURE | June 2 - Thursday 11:15 a.m. - 12:15 p.m. Nuances and Complications in IR Data Interpretation This lecture goes over some simple strategies in interpreting FT-IR spectra. We will discuss the factors that influence peak positions and widths, and go over ways of assigning peaks. SIGN UP TO ATTEND IN-PERSON: SIGN UP TO ATTEND VIRTUALLY: |
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June 7 - Tuesday Raman spectroscopy is one of the most referenced techniques when determining structure or defects in carbon materials. However, countless papers will reference the D/G peak intensity ratio from the Raman spectrum of carbon materials without the realization or acknowledgment that this ratio is non-monotonic with respect to the amorphitization trajectory of carbon. Come find out the correct method for interpreting defects in carbon materials and all that can be revealed through Raman analysis of carbon materials. SIGN UP TO ATTEND IN-PERSON: SIGN UP TO ATTEND VIRTUALLY: |
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| WORKSHOP | June 9 - Thursday 11:15 a.m. - 12:15 p.m. OPUS FTIR Data Processing This will go over some simple data processing function available in OPUS, such as peak fitting, integration, Fourier transforms and apodization. IN-PERSON ONLY: |
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June 14 - Tuesday SIGN UP TO ATTEND IN-PERSON: SIGN UP TO ATTEND VIRTUALLY: |
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| WORKSHOP | June 16 - Thursday 11:15 a.m. - 12:15 p.m. LabSpec6 Processing, Peak Fitting and Analysis This workshop is intended for current Raman users. IN-PERSON ONLY: |
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| LECTURE | June 21 - Tuesday 11:15 a.m. - 12:15 p.m. Intro to AFM This is an introduction to AFM lecture. It is aimed at anyone that is interested in learning about AFM and how it works. SIGN UP TO ATTEND IN-PERSON: SIGN UP TO ATTEND VIRTUALLY: |
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| WORKSHOP | June 23 - Thursday 11:15 a.m. - 12:15 p.m. Thin Film Characterization with X-Ray Reflectivity (XRR) Workshop on the non-destructive characterization of thin film samples using X-Ray Reflectivity (XRR) to determine film thickness, density, and roughness information of heterostructure samples. IN-PERSON ONLY: |
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| WORKSHOP | June 28 - Tuesday 11:15 a.m. - 12:15 p.m. AFM Data Analysis with Nanocope Analysis and Gwyiddion A workshop on AFM data analysis with Nanoscope Analysis and Gwyddion. IN-PERSON ONLY: |
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JULY SCHEDULE |
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July 7 - Thursday Details in progress SIGN UP TO ATTEND IN-PERSON: |
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July 12 - Tuesday Details in progress IN-PERSON ONLY: SIGN UP TO ATTEND VIRTUALLY: |
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July 14 - Thursday Details in progress SIGN UP TO ATTEND IN-PERSON: SIGN UP TO ATTEND VIRTUALLY: |
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| WORKSHOP | July 19 - Tuesday 11:15 a.m. - 12:15 p.m. Diel Details in progress IN-PERSON ONLY: |
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| LECTURE | July 21 - Thursday 11:15 a.m. - 12:15 p.m. Basic Principles of Powder X-ray Diffraction Details in progress SIGN UP TO ATTEND IN-PERSON: SIGN UP TO ATTEND VIRTUALLY: |
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| LECTURE | July 26 - Tuesday 11:15 a.m. - 12:15 p.m. Introduction to Auger Spectroscopy Details in progress IN-PERSON ONLY: SIGN UP TO ATTEND VIRTUALLY: |
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| WORKSHOP | July 28 - Thursday 11:15 a.m. - 12:15 p.m. Diel Details in progress IN-PERSON ONLY: |
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